Mission: To facilitate advanced research in various fields of Science & Technology at Nanoscale leading to the development of innovative products for societal benefits.

Vision: To establish the Centre of Excellence in the field of Nanoscience and Nanotechnology for developing technologies through Research, Awareness and Consultancy

X-RAY DIFFRACTOMETER - HIGH TEMPERATURE MODE

X-ray diffraction (XRD) at non-ambient conditions can be used for a variety of applications, including the study of dynamic processes that need to be investigated in situ. Examples of such processes are the reactions involving the solid state, phase transitions, crystallite growth, thermal expansion, etc. Measurements of lattice parameters at high temperature also provides information on thermal expansion coefficients of crystalline materials

Sl.NO Temperature (°C)# Amount in Rs
1 Room temperature (RT) 675
2 100 1350`
3 200 2025
4 300 2700
5 400 3375
6 500 4050
7 600 4725
8 700 5400
9 800 6075
10 900 6750
11 1000 7425
  1. Default holding and scan rates are : 15 mins and 4 deg/min in the range of RT-1000 C
  2. #Complete Scan includes 11 profiles at different temperatures.
  3. #A Minimum recording at four different temperatures (e.g. RT, 800, 900, 1000) will be charged Rs.5000.
  4. *Holding time and scan rate can be varied as per the researchers requirements provided the amount will be charged accordingly.